2 edition of Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys found in the catalog.
Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys
Albert J. Weigand
Published
1977
by National Aeronautics and Space Administration, Scientific and Technical Information Office, for sale by the National Technical Information Service in Washington, Springfield, Va
.
Written in English
Edition Notes
Statement | Albert J. Weigand, M. Lise Meyer, and Jerri S. Ling. |
Series | NASA technical memorandum ; NASA TM X-3553, NASA technical memorandum -- X-3553. |
Contributions | Meyer, M. Lise., Ling, Jerri S., United States. National Aeronautics and Space Administration. |
The Physical Object | |
---|---|
Pagination | 31 p. : |
Number of Pages | 31 |
ID Numbers | |
Open Library | OL15219002M |
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